Prater, Craig: search on Z-Library

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1

AFM-IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization

Dazzi, Alexandre, Prater, Craig B., Hu, Qichi, Chase, D. Bruce, Rabolt, John F., Marcott, Curtis

Journal:

Applied Spectroscopy

Year:

2012

Language:

english

File:

PDF, 2.39 MB

english, 2012

2

AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging

Dazzi, Alexandre, Prater, Craig B.

Journal:

Chemical Reviews

Year:

2016

Language:

english

File:

PDF, 34.75 MB

english, 2016

3

Theoretical modelling and implementation of elastic modulus measurement at the nanoscale using atomic force microscope

Belikov, Sergey, Magonov, Sergei, Erina, Natalia, Huang, Lin, Su, Chanmin, Rice, Alan, Meyer, Charles, Prater, Craig, Ginzburg, Valeriy, Meyers, Gregory, McIntyre, Robert, Lakrout, Hamed

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 637 KB

english, 2007

4

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

Stan, Gheorghe, Gates, Richard S, Hu, Qichi, Kjoller, Kevin, Prater, Craig, Jit Singh, Kanwal, Mays, Ebony, King, Sean W

Journal:

Beilstein Journal of Nanotechnology

Year:

2017

Language:

english

File:

PDF, 2.79 MB

english, 2017

5

Spatial Differentiation of Sub-Micrometer Domains in a Poly(hydroxyalkanoate) Copolymer Using Instrumentation that Combines Atomic Force Microscopy (AFM) and Infrared (IR) Spectroscopy

Marcott, Curtis, Lo, Michael, Kjoller, Kevin, Prater, Craig, Noda, Isao

Journal:

Applied Spectroscopy

Year:

2011

Language:

english

File:

PDF, 732 KB

english, 2011

6

Applications of AFM-IR—Diverse Chemical Composition Analyses at Nanoscale Spatial Resolution

Marcott, Curtis, Lo, Michael, Kjoller, Kevin, Prater, Craig, Gerrard, David P.

Journal:

Microscopy Today

Year:

2012

Language:

english

File:

PDF, 1.39 MB

english, 2012

7

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Micro- and Nanotechnology Sensors, Systems, and Applications IV - Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Lo, Michael, George, Thomas, Islam, M. Saif, Prater, Craig, Dazzi, Alexandre, Dutta, Achyut, Shetty, Roshan, Kjoller, Kevin

Year:

2012

Language:

english

File:

PDF, 3.87 MB

english, 2012

8

Interface Analysis of Composites Using AFM-Based Nanoscale IR and Mechanical Spectroscopy

Marcott, Curtis, Lo, Michael, Dillon, Eoghan, Kjoller, Kevin, Prater, Craig

Journal:

Microscopy Today

Year:

2015

Language:

english

File:

PDF, 1.83 MB

english, 2015

9

Top Launch for Higher Off-axis Electron Cyclotron Current Drive Efficiency

Chen, Xi, Prater, Ron, Petty, Craig, Lohr, John, Su, David, Lao, Lang, Chan, Vincent, Poli, E., Laqua, H., Oosterbeek, J.

Journal:

EPJ Web of Conferences

Year:

2019

Language:

english

File:

PDF, 937 KB

english, 2019

10

tudy of the Surface Cleaning Effects to the InGaAs Quantum Well Wires by Atomic Force Microscopy and Photoluminescence Spectroscopy

Tan, I-Hsing, Stone, Song Shi, Prater, Craig, Mirin, Richard, Hu, Evelyn, Bowers, John, Merz, James, Hansma, Paul

Journal:

MRS Proceedings

Year:

1992

Language:

english

File:

PDF, 1.52 MB

english, 1992

11

Lorentz force actuation of a heated atomic force microscope cantilever

Lee, Byeonghee, Prater, Craig B, King, William P

Journal:

Year:

2012

Language:

english

File:

PDF, 1.78 MB

english, 2012

12

Optical Photothermal Infrared Microspectroscopy with Simultaneous Raman â A New Non-Contact Failure Analysis Technique for Identification of

Kansiz, Mustafa, Prater, Craig, Dillon, Eoghan, Lo, Michael, Anderson, Jay, Marcott, Curtis, Demissie, Abel, Chen, Yanling, Kunkel, Gary

Journal:

Microscopy Today

Year:

2020

File:

PDF, 9.01 MB

2020

13

Nanoscale Chemical-Mechanical Characterization of Nanoelectronic Low- k Dielectric/Cu Interconnects

Lo, Michael K. F., Dazzi, Alexandre, Marcott, Curtis A., Dillon, Eoghan, Hu, Qichi, Kjoller, Kevin, Prater, Craig B., King, Sean W.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1009 KB

english, 2016

14

Variation of magnetoresistive sensitivity maps of patterned giant magnetoresistance sensors

Foss-Schroeder, Sheryl, van Ek, Johannes, Song, Dian, Louder, Darrell, Al-Jumaily, Ghanim, Ryan, Pat, Prater, Craig, Hachfeld, Ed, Wilson, Matt, Tench, Robert

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 565 KB

english, 2001

15

fJoint AAD-NPF Guidelines of care for the management and treatment of psoriasis with topical therapy and alternative medicine modalities for psoriasis severity measures

Elmets, Craig A., Korman, Neil J., Prater, Elizabeth Farley, Wong, Emily B., Rupani, Reena N., Kivelevitch, Dario, Armstrong, April W., Connor, Cody, Cordoro, Kelly M., Davis, Dawn M.R., Elewski, Boni

Journal:

Journal of the American Academy of Dermatology

Year:

2020

File:

PDF, 4.38 MB

2020

16

Quantized adhesion detected with the atomic force microscope

Hoh, Jan H., Cleveland, Jason P., Prater, Craig B., Revel, Jean Paul, Hansma, Paul K.

Journal:

Journal of the American Chemical Society

Year:

1992

Language:

english

File:

PDF, 290 KB

english, 1992

17

Nanoscale Organic Defect Characterization with AFM-IR

Marcott, Curtis, Lo, Michael, Hu, Qichi, Kjoller, Kevin, Prater, Craig B.

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

18

How to unravel the chemical structure and component localization of individual drug-loaded polymeric nanoparticles by using tapping AFM-IR

Mathurin, Jérémie, Pancani, Elisabetta, Deniset-Besseau, Ariane, Kjoller, Kevin, Prater, Craig B., Gref, Ruxandra, Dazzi, Alexandre

Journal:

The Analyst (Royal Society of Chemistry)

Year:

2018

Language:

english

File:

PDF, 1.98 MB

english, 2018

19

Monitoring TriAcylGlycerols Accumulation by Atomic Force Microscopy Based Infrared Spectroscopy in Streptomyces Species for Biodiesel Applications

Deniset-Besseau, Ariane, Prater, Craig B., Virolle, Marie-Joëlle, Dazzi, Alexandre

Journal:

The Journal of Physical Chemistry Letters

Year:

2014

Language:

english

File:

PDF, 2.25 MB

english, 2014

20

Micromechanical contact stiffness devices and application for calibrating contact resonance atomic force microscopy

Rosenberger, Matthew R, Chen, Sihan, Prater, Craig B, King, William P

Journal:

Year:

2017

Language:

english

File:

PDF, 2.54 MB

english, 2017

21

Sub-Micron to Nanoscale Chemical Characterization of Biological Systems using Laser and AFM Based IR Spectroscopy

Dillon, Eoghan, Roy, Anirban, Marcott, Curtis, Prater, Craig

Journal:

Biophysical Journal

Year:

2018

Language:

english

File:

PDF, 43 KB

english, 2018

22

Nanoscale infrared spectroscopy

Craig Prater, Kevin Kjoller, Roshan Shetty

Journal:

Materials Today

Year:

2010

Language:

english

File:

PDF, 759 KB

english, 2010

23

Multifunctional atomic force microscope cantilevers with Lorentz force actuation and self-heating capability

Somnath, Suhas, Liu, Joseph O, Bakir, Mete, Prater, Craig B, King, William P

Journal:

Year:

2014

Language:

english

File:

PDF, 2.33 MB

english, 2014

24

Chemical Analysis Below the Diffraction Limit using Infrared-Coupled Atomic Force Microscopy (AFM-IR)

Heedy, Sara, Lo, Michael, Dillon, Eoghan, Hu, Qichi, Prater, Craig, Shetty, Roshan, Kjoller, Kevin, Marcott, Curtis, Dazzi, Alexandre, Yip, Christopher

Journal:

Biophysical Journal

Year:

2014

Language:

english

File:

PDF, 91 KB

english, 2014

25

Lorentz Contact Resonance Imaging for Atomic Force Microscopes: Probing Mechanical and Thermal Properties on the Nanoscale

Dillon, Eoghan, Kjoller, Kevin, Prater, Craig

Journal:

Microscopy Today

Year:

2013

Language:

english

File:

PDF, 1.84 MB

english, 2013

26

SPIE Proceedings [SPIE Micro - DL Tentative - San Jose, CA (Sunday 1 March 1992)] Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing II - Low-damage anisotropic radical-beam ion-beam etching and selective chemical etching of focused-ion-beam-damaged GaAs substrates

Skidmore, Jay A., Peckerar, Martin C., Spiers, Guy D., English, John H., Xu, Zheng, Prater, Craig B., Coldren, Larry A., Hu, Evelyn L., Petroff, Pierre M.

Year:

1992

Language:

english

File:

PDF, 491 KB

english, 1992

27

Nanometer-Scale Infrared Spectroscopy of Heterogeneous Polymer Nanostructures Fabricated by Tip-Based Nanofabrication

Felts, Jonathan R., Kjoller, Kevin, Lo, Michael, Prater, Craig B., King, William P.

Journal:

Year:

2012

Language:

english

File:

PDF, 546 KB

english, 2012

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